Mr. Alastair Trigg obtained his BSc from Exeter University (UK) in 1972 and his PhD from London University in 1978. From 1975 to 1986 he worked for the Hirst Research Centre of GEC Marconi(UK) in the fields of materials and device characterization and failure analysis, working extensively on silicon and III-V semiconductors. From 1987 to 1990 he was Deputy Director of the Research Initiative on Silicon Hybrids (MCMs) In 1990 he returned to GEC Marconi to work on advanced packaging including thick and thin film hybrids for space and other high reliability applications. He subsequently became project leader for manufacture of high stability oscillators for communications satellites. In 1995 he joined the Institute of Microelectronics in Singapore where he has worked on infrared photoemission microscopy, surface analysis, failure analysis and the development of MCMs. Since 2006 he has been on secondment to Setsco Services Pte Ltd where he is Consultant in Microelectronics. Alastair was General Chair of the 13th International Symposium on the Physical and Failure Analysis of Integrated circuits (IPFA 2006). He is a Senior Member of IEEE, Professional Member of the Institute of Materials, Minerals and Mining, Member of the Institute of Physics, Fellow of the Royal Microscopical Society and Member of the Electronic Device Failure Analysis Society. He is currently chairman of the IEEE Singapore Reliability/CPMT/Electron Devices Chapter. |
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